@inproceedings{ban2020_ac519a695197,
  author = {Ban, Byunghyun},
  title = {{Deep learning method to remove chemical, kinetic and electric artifacts on ISEs}},
  year = {2020},
  booktitle = {2020 International Conference on Information and Communication Technology Convergence (ICTC)},
  pages = {1242--1246},
  doi = {10.1109/ictc49870.2020.9289389},
  url = {https://doi.org/10.1109/ictc49870.2020.9289389}
}